Current oscillations in the anodic dissolution of silicon: On the origin of a sustained oscillation on the macroscopic scaleCHAZALVIEL, J.-N; OZANAM, F.Electrochimica acta. 2010, Vol 55, Num 3, pp 656-665, issn 0013-4686, 10 p.Article

Fourier transform, electromodulated, infrared spectrometer for studies at the electrochemical interfaceOZANAM, F; CHAZALVIEL, J.-N.Review of scientific instruments. 1988, Vol 59, Num 2, pp 242-248, issn 0034-6748Article

A theory for the resonant response of an electrochemical system : self-oscillating domains, hidden oscillation, and synchronization impedanceCHAZALVIEL, J.-N; OZANAM, F.Journal of the Electrochemical Society. 1992, Vol 139, Num 9, pp 2501-2508, issn 0013-4651Article

An interface-free-energy approach to semiconductor electrode chemistry: Examples of Si and GeCHAZALVIEL, J.-N; MAROUN, F; OZANAM, F et al.Journal of the Electrochemical Society. 2004, Vol 151, Num 2, pp E51-E55, issn 0013-4651Article

In situ infrared evidence for the electrochemical incorporation of hydrogen into Si and GeMANDAL, K. C; OZANAM, F; CHAZALVIEL, J.-N et al.Applied physics letters. 1990, Vol 57, Num 26, pp 2788-2790, issn 0003-6951, 3 p.Article

In situ characterization of the n-Si/acetonitrile interface by electromodulated infrared internal-reflection spectroscopyVENKATESWARA RAO, A; CHAZALVIEL, J.-N; OZANAM, F et al.Journal of applied physics. 1986, Vol 60, Num 2, pp 696-706, issn 0021-8979Article

Fully methylated, atomically flat (111) silicon surfaceFIDELIS, A; OZANAM, F; CHAZALVIEL, J.-N et al.Surface science. 2000, Vol 444, Num 1-3, pp L7-L10, issn 0039-6028Article

Infrared determination of small variations of local pHMAROUN, F; OZANAM, F; CHAZALVIEL, J.-N et al.Journal of electroanalytical chemistry (1992). 1997, Vol 435, Num 1-2, pp 225-228, issn 1572-6657Article

Rôle of dielectric effects in the red-green switching of porous silicon luminescenceCHAZALVIEL, J.-N; OZANAM, F; DUBIN, V. M et al.Journal de physique. I. 1994, Vol 4, Num 9, pp 1325-1339, issn 1155-4304Article

Nano- and macropore formation in p-type siliconWEHRSPOHN, R. B; OZANAM, F; CHAZALVIEL, J.-N et al.Journal of the Electrochemical Society. 1999, Vol 146, Num 9, pp 3309-3314, issn 0013-4651Article

Macropore formation in highly resistive p-type crystalline siliconWEHRSPOHN, R. B; CHAZALVIEL, J.-N; OZANAM, F et al.Journal of the Electrochemical Society. 1998, Vol 145, Num 8, pp 2958-2961, issn 0013-4651Article

Microscopic, self-oscillating domains at the silicon surface during its anodic dissolution in a fluoride electrolyteOZANAM, F; BLANCHARD, N; CHAZALVIEL, J.-N et al.Electrochimica acta. 1993, Vol 38, Num 12, pp 1627-1630, issn 0013-4686Article

A voltammetric study of the anodic dissolution of p-Si in fluoride electrolytesCHAZALVIEL, J.-N; ETMAN, M; OZANAM, F et al.Journal of electroanalytical chemistry and interfacial electrochemistry. 1991, Vol 297, Num 2, pp 533-540, issn 0022-0728, 8 p.Article

In situ Fourier-transform electromodulated infrared study of porous silicon formation : evidence for solvent effects on the vibrational linewidthsVENKATESWARA RAO, A; OZANAM, F; CHAZALVIEL, J.-N et al.Journal of the Electrochemical Society. 1991, Vol 138, Num 1, pp 153-159, issn 0013-4651Article

In-situ infrared investigations of the electrochemistry of heteropolyacids at n-Ge electrodesMANDAL, K. C; OZANAM, F; CHAZALVIEL, J.-N et al.Journal of electroanalytical chemistry (1992). 1992, Vol 336, Num 1-2, pp 153-170, issn 1572-6657Article

In situ infrared characterisation of the interfacial oxide during the anodic dissolution of a silicon electrode in fluoride electrolytesDA FONSECA, C; OZANAM, F; CHAZALVIEL, J.-N et al.Surface science. 1996, Vol 365, Num 1, pp 1-14, issn 0039-6028Article

In situ photoluminescence and photomodulated infrared study of porous silicon during etching and in ambientDUBIN, V. M; CHAZALVIEL, J.-N; OZANAM, F et al.Journal of luminescence. 1993, Vol 57, Num 1-6, pp 61-65, issn 0022-2313Article

The hydrogenated silicon surface in organic electrolytes probed through in situ ir spectroscopy in the ATR geometryOZANAM, F; DJEBRI, A; CHAZALVIEL, J.-N et al.Electrochimica acta. 1996, Vol 41, Num 5, pp 687-692, issn 0013-4686Article

The Titration of Carboxyl-Terminated Monolayers Revisited : In Situ Calibrated Fourier Transform Infrared Study of Well-Defined Monolayers on SiliconAUREAU, D; OZANAM, F; ALLONGUE, P et al.Langmuir. 2008, Vol 24, Num 17, pp 9440-9448, issn 0743-7463, 9 p.Article

Surface composition of n-GaAs cathodes during hydrogen evolution characterized by in situ ultraviolet-visible ellipsometry and in situ infrared spectroscopyERNE, B. H; STCHAKOVSKY, M; OZANAM, F et al.Journal of the Electrochemical Society. 1998, Vol 145, Num 2, pp 447-456, issn 0013-4651Article

Temperature dependence of photoluminescence in amorphous Si_1-xC_x:H filmsRERBAL, K; SOLOMON, I; CHAZALVIEL, J.-N et al.The European physical journal. B, Condensed matter physics. 2006, Vol 51, Num 1, pp 61-64, issn 1434-6028, 4 p.Article

Increased hole injection in organic diodes by grafting of dipolar molecules on indium-tin oxideSIGAUD, P; CHAZALVIEL, J.-N; OZANAM, F et al.Applied surface science. 2003, Vol 218, Num 1-4, pp 54-57, issn 0169-4332, 4 p.Article

Anodic dissolution and electroluminescence of p-Si at high potentials in fluoride mediaLHARCH, M; AGGOUR, M; CHAZALVIEL, J.-N et al.Journal of the Electrochemical Society. 2002, Vol 149, Num 5, pp C250-C255, issn 0013-4651Article

Resonant and nonresonant behavior of the anodic dissolution of silicon in fluoride media : an impedance studyOZANAM, F; CHAZALVIEL, J.-N; RADI, A et al.Journal of the Electrochemical Society. 1992, Vol 139, Num 9, pp 2491-2501, issn 0013-4651Article

Macromorphologies in electrochemically formed porous silicaAMIN, M. A; FREY, S; OZANAM, F et al.Electrochimica acta. 2008, Vol 53, Num 13, pp 4485-4494, issn 0013-4686, 10 p.Article